BN growth temperature by substrate
Select the film structure to suit your substrate and thermal budget. Growth temperatures are shown in °C.
Raman spectroscopy is used to confirm hBN. On GaN, a-BN is offered at 400 °C; hBN is not currently offered.
These temperatures apply to direct BN deposition on the listed substrates. Growth conditions for bare Si and few-layer MoS₂ are confirmed on enquiry.
PECVD BN on Si or Si/SiO₂
PECVD a-BN and hBN coatings on Si or Si/SiO₂. On Si/SiO₂: a-BN growth below 600 °C; hBN growth above 1000 °C. Conditions for bare Si are confirmed on enquiry. Nominal BN thickness: up to 100 nm. Max. sample size 4 × 4 cm.
NT$25,000 · coating only
Coating + XPS, Raman, AFM and XRD: NT$100,000Please enquire for further details.Enquire about this materialPECVD a-BN on GaN
PECVD amorphous BN (a-BN) on GaN at a growth temperature of 400 °C. hBN is not currently offered on GaN. Nominal BN thickness: up to 100 nm. Customers must supply the GaN substrate. Max. sample size 4 × 4 cm.
NT$25,000 · coating only
Coating + XPS, Raman, AFM and XRD: NT$100,000Please enquire for further details.Enquire about this materialPECVD BN on SiC
PECVD a-BN and hBN coatings on SiC. Growth temperature: below 600 °C for a-BN; above 1000 °C for hBN. Raman spectroscopy is used to confirm hBN. Nominal BN thickness: up to 100 nm. Customers must supply the SiC substrate. Max. sample size 4 × 4 cm.
NT$25,000 · coating only
Coating + XPS, Raman, AFM and XRD: NT$100,000Please enquire for further details.Enquire about this materialPECVD BN on Ga₂O₃
PECVD a-BN and hBN coatings on Ga₂O₃. Growth temperature: below 600 °C for a-BN; 750 °C for hBN. Raman spectroscopy is used to confirm hBN. Nominal BN thickness: up to 100 nm. Customers must supply the Ga₂O₃ substrate. Max. sample size 4 × 4 cm.
NT$25,000 · coating only
Coating + XPS, Raman, AFM and XRD: NT$100,000Please enquire for further details.Enquire about this materialPECVD BN on sapphire
PECVD a-BN and hBN coatings on sapphire. Growth temperature: below 700 °C for a-BN; above 900 °C for hBN. Raman spectroscopy is used to confirm hBN. Nominal BN thickness: up to 100 nm. Max. sample size 4 × 4 cm.
NT$25,000 · coating only
Coating + XPS, Raman, AFM and XRD: NT$100,000Please enquire for further details.Enquire about this materialhBN 4.1 eV emitter on Si/SiO₂
hBN 4.1 eV emitter supplied on a Si/SiO₂ substrate. Sample size: 4 × 4 cm only.
4.1 eV emission confirmed by cathodoluminescence measurements at 300 K and 10 K. See data.
NT$25,000 · per 4 × 4 cm sample
Enquire for detailsEnquire about this materialPECVD BN on substrate + material characterization
Nominal PECVD BN coating up to 100 nm thick on Si, Si/SiO₂, sapphire, SiC, GaN or Ga₂O₃, including XPS, Raman, AFM and XRD characterization. Film structure and growth temperature depend on the substrate, as shown in the table. GaN: a-BN only, at 400 °C. Max. sample size 4 × 4 cm.
NT$100,000 · coating + material characterization
GaN, SiC and Ga₂O₃ substrates must be supplied by the customer.
Make an enquiryEnquire about this materialBN PECVD on substrate + material characterization + HRTEM
Nominal PECVD BN coating up to 100 nm thick on Si, Si/SiO₂, sapphire, SiC, GaN or Ga₂O₃, including XPS, Raman, AFM, XRD and HRTEM. Film structure and growth temperature depend on the substrate, as shown in the table. GaN: a-BN only, at 400 °C. Max. sample size 4 × 4 cm.
NT$130,000 · coating + material characterization + HRTEM
GaN, SiC and Ga₂O₃ substrates must be supplied by the customer.
Make an enquiryEnquire about this material